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Re: Power analysis of AES candidates

daemon@ATHENA.MIT.EDU (Arnold Reinhold)
Tue Sep 14 16:22:27 1999

In-Reply-To: <14301.13606.727308.543977@lrz.de>
Date: Tue, 14 Sep 1999 13:25:07 -0400
To: Eugene Leitl <eugene.leitl@lrz.uni-muenchen.de>,
        Andreas Bogk <andreas@andreas.org>
From: Arnold Reinhold <reinhold@world.std.com>
Cc: Russell Nelson <nelson@crynwr.com>,
        "Cryptography@C2. Net" <cryptography@c2.net>

At 10:32 AM -0700 9/13/99, Eugene Leitl wrote:
>Why don't you just erase flash when a pressure change (hull breach) is
>detected. Using double-walled hull, to look for shortcuts.  You can
>also couple this to light detection, and whatnot.
>
>Andreas Bogk writes:
> > Russell Nelson <nelson@crynwr.com> writes:
> >
> > >  > There's some question about how hard it will be to design
> > >  > hardware that will be DPA-resistant for different
> > >  > algorithms.
> > > Big on-chip caps.  Lithium batteries.  Tamper-resistant housings.
>[...]

A sophisticated attacker could measure the pressure in each 
compartment and work in a pressurized, darkened room.

One thought I had is to include a circuit on chip (perhaps duplicated 
in several places) that would monitor on-chip supply voltage and keep 
the program from executing sensitive code for some period if dV/dt 
were too high.  If the cap or Li battery were disconnected, the 
circuit would see continuous fluctuations and shut the processor 
down. A accidental power glitch would only cause a short delay in 
execution.

If an attacker can get to the chip and disable these power monitor 
circuits, he can probably also put a logic analyzer on the memory 
lines and extract the key that way.

Arnold Reinhold



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