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ADV: POINT. CLICK. TEST. The Connect2it Newsletter

daemon@ATHENA.MIT.EDU (listservices@connect2it.com)
Wed Jun 26 16:13:23 2002

From: listservices@connect2it.com"Connect2it Customer Service"
To: os2www@mit.edu
Reply-To: listservices@connect2it.com
Date: 26 Jun 2002 15:13:20 -0500


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**0-19Ghz in Just 201 Mils**

This is just one of the many attributes of our Micron M030A series of 
semiconductor probes. If you are looking for high frequency, high quality 
or just simply high reliability, this probe has it all. While conventional 
spring probes use a design that rely on friction between the barrel and 
plunger to make contact, in dirty environments this allows for 
contamination to work its way between the barrel and plunger, thereby 
interfering with conductivity. The internal resistance of Micron Series 
probe will be virtually unaffected by contamination present in the test 
environment due to
its unique construction; the Micron probe uses a spring-over-plunger crimp 
design that has proven itself to be impervious to contamination. Micron 
Series Semiconductor Probes have been tested to 19GHZ, far above standard 
design probes. In the arena of high speed device interfaces, Micron probes 
are invaluable.

For these and many other innovative test solutions, check us out at 
www.Connect2it.com 


http://www.connect2it.com/


We hope that you have enjoyed receiving this issue of POINT. CLICK. TEST. 
(R) The Connect2it Newsletter.  If you wish to unsubscribe from the 
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    <td><p align="center"><a href="http://www.connect2it.com/"><img src="http://www.connect2it.com/newsletters/020506_images/c2it_logo.gif" width="144" height="110" border="0"></a></p>
      <p align="center"><font size="6" face="Arial, Helvetica, sans-serif"><em><strong>0-19Ghz 
        in just 201 Mils</strong></em></font></p>
      <p align="center" class="TitleTextSer"><a href="http://www.connect2it.com/C2itSecure/001/index.cfm"><img src="http://www.connect2it.com/newsletters/020626_images/speed_limit.gif" width="400" height="400" border="0"></a></p>
      <p class="PlainText">This is just one of the many attributes of our Micron 
        M030A series of
        semiconductor probes. If you are looking for high frequency, high quality 
        or just simply high reliability, this probe has it all. While conventional
        spring probes use a design that rely on friction between the barrel and
        plunger to make contact, in dirty environments this allows for contamination
        to work its way between the barrel and plunger, thereby interfering with
        conductivity. The internal resistance of Micron Series probe will be
        virtually unaffected by contamination present in the test environment 
        due to its unique construction; the Micron probe uses a spring-over-plunger crimp
        design that has proven itself to be impervious to contamination. Micron
        Series Semiconductor Probes have been tested to 19GHZ, far above standard
        design probes. In the arena of high speed device interfaces, Micron probes
        are invaluable.</p>
      <table border="0" cellpadding="0" cellspacing="0">
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          <td class="PlainText"> <div align="center"><a href="http://www.connect2it.com/C2itSecure/001/index.cfm">The 
              Micron Series Probe From Connect2it</a>.</div></td>
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          <td><a href="http://www.connect2it.com/C2itSecure/001/index.cfm"><img src="http://www.connect2it.com/images/front_page/micron.gif" width="300" height="150" border="0"></a></td>
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